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Semiconsoft  
Semiconsoft, Inc.是世界上薄膜厚度分析軟件和薄膜測(cè)量硬件解決方案的領(lǐng)導(dǎo)者。公司的TFCompanion軟件被大多數(shù)的計(jì)量學(xué)公司以及國(guó)際知名的R&D組織采用，應(yīng)用領(lǐng)域遍布半導(dǎo)體、生物技術(shù)、數(shù)據(jù)存儲(chǔ)、顯示、化學(xué)以及光學(xué)鍍膜工業(yè)等。從最復(fù)雜的光譜學(xué)以及成像學(xué)橢偏儀到小而廉價(jià)的光纖光學(xué)發(fā)射計(jì)，我們的計(jì)量學(xué)儀器生產(chǎn)線集成了世界上最好的、最先進(jìn)的硬件工藝，界面友好、功能強(qiáng)大而且簡(jiǎn)單易用。
成立于2001年的Semiconsoft公司坐落在麻省的Southborough，起初主要提供薄膜分析軟件以及為半導(dǎo)體R&D以及生產(chǎn)公司提供服務(wù)，2002年公司開始生產(chǎn)TFCompanion軟件，并且在這個(gè)領(lǐng)域始終持續(xù)保持前進(jìn)的勢(shì)頭，不斷增加新的功能，軟件被公認(rèn)為薄膜測(cè)量領(lǐng)域的領(lǐng)導(dǎo)者。2004年，公司發(fā)布了誤差評(píng)估模塊來預(yù)測(cè)不同測(cè)量環(huán)境下的測(cè)量精確度。2005年，公司與知名的硬件制造商合作，爭(zhēng)取以系統(tǒng)集成的方式為客戶的薄膜測(cè)量技術(shù)提供最優(yōu)化的解決方案。

Semiconsoft, Inc.is a world leader in providing thin films data analysis software and thin-films measurement hardware solutions. Our TFCompanion software is used by many major metrology companies and leading R&D organizations, in semiconductor, biotechnology, data storage, display, chemistry and optical coating industries.Our line of metrology instruments from the most sophisticated spectroscopic and imaging ellipsometers to small and cost effective fiber-optics reflectometers combines the best and latest hardware technology with the user friendly, powerful, yet, easy to use software.

Semiconsoft, Inc. is a privately held company with headquarters in Southborough, Massachusetts. It was founded in 2001 with the mission to provide thin-film analysis software and services for semiconductor R&D and production. TFCompanion software was introduced in 2002. We continue active development of TFCompanion and constantly adding new features and capabilities. It is recognized as a leading thin-film data analysis software. One of the challenges of optical metrology, as an indirect measurement technique, is the selection of measurement methods and conditions to achieve optimal precision on specific application: this problem is faced by metrology manufacturers, production users or researchers alike. In 2004 we have introduced an ErrorEstimator module that allows to estimate accurately the measurement precision depending on measurement condition, application and technique. In 2005 we partnered with the leading hardware manufacturers to combine the recent advances in hardware and software and offer a full line of modular thin-film measurement solutions that can be customized for specific application. PicoProbe series of single wavelength and spectroscopic systems offer unparalleled speed and precision, PicoScan imaging ellipsometer system offer high spatial resolution, M-Probe spectral reflectometer systems offer small, precise and affordable solution for in-situ and ex-situ measurement, TR-Probe offer application customized high-precision reflectometer systems for the wide spectral range.